TIA TIA/EIA-455-132A
TA TAEA-455-132A 2001-JUN-01 FOTP-132 Measurement of the Effectve Area of Sngle-Mode Optcal Fber
TA TAEA-455-132A 2001-JUN-01 FOTP-132 Measurement of the Effectve Area of Sngle-Mode Optcal Fber
This document defines three methods of measuring Aeff. Information common to all themethods is found in the body of this document. Information specific to each method isfound in a normative annex. The three methods are:
A Direct far-field (DFF)
B Variable aperture in the far-field (VAMFF)
C Near-field (NF)
The reference method, used to resolve disputes, is Method A, direct far-field.