JEDEC JESD531
JEDEC JESD531 1986-JUL-01 Thermal Resstance Test Method for Sgnal and Regulator Dodes Forward Voltage Swtchng Method-Reaffrmaton of ANSEA-531-1986 Prevously Publshed as S-13 Replaces JEDEC JEP 90
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This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that existed earlier for both signal and regulator diode applications in testing for thermal resistance. Previously published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996. Became JESD531 after reaffirmation April 2002.