JEDEC JESD51-6
JEDEC JESD51-6 1999-MAR-01 ntegrated Crcut Thermal Test Method Envronmental Condtons - Forced Convecton Movng Ar
JEDEC JESD51-6 1999-MAR-01 ntegrated Crcut Thermal Test Method Envronmental Condtons - Forced Convecton Movng Ar
This standard specifies the environmental conditions for determining thermal performance of an integrated circuit device in a forced convection environment when mounted on a standard thermal test board.