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Home>JEDEC JESD28-1

JEDEC JESD28-1

JEDEC JESD28-1 2001-SEP-01 N-Channel MOSFET Hot Carrer Data Analyss

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This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

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