JEDEC JEP147
JEDEC JEP147 2003-OCT-01 Procedure for Measurng nput Capactance Usng a Vector Network Analyzer VNA
JEDEC JEP147 2003-OCT-01 Procedure for Measurng nput Capactance Usng a Vector Network Analyzer VNA
This procedure describes a recommended way to measure pin capacitance of devices with SSTL (Stub Series Terminated Logic) interface pins by use of a Vector Network Analyzer. One purpose of this standard procedure is to reduce the lengthy and often inaccurate footnote - usually found around the specification of pin parasitics - to a simple reference to this document. In special cases modifying statements may adjust this procedure to the special needs of certain component.