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Home>JEDEC JEB15

JEDEC JEB15

JEDEC JEB15 1969-JAN-01 Termnology and Methods of Measurement for Bstable Semconductor Mcrocrcuts

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This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.

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