JEDEC EIA-323
JEDEC EA-323 1966-MAR-01 Ar-Convecton-Cooled Lfe Test Envronment for Lead-Mounted Semconductor Devces
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This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.