ECA CB 5-1
ECA CB 5-1 1971-MAY-01 Recommended Test Procedure for Semconductor Thermal Dsspatng Devces-Addendum to CB5
ECA CB 5-1 1971-MAY-01 Recommended Test Procedure for Semconductor Thermal Dsspatng Devces-Addendum to CB5
The scope of this supplement to EIA Components Bulletin No. 5 is to present methods of instrumentation for plastic case semiconductors and integrated circuits for evaluation of thermal dissipating devices.