This method provides procedures for the measurement of effective series resistance (esr) and capacitance of multilayer ceramic capacitors from frequencies of 25 MHz to 1.25 GHz. A series connection permits the measurement of capacitance from below 1 pF to over 1 nF between frequencies of 130 MHz and 1.25 GHz. There is no maximum value of capacitance for series measurements of esr, but the determination of large values of capacitance at high frequencies suffers from inaccuracy. The esr of capacitors can be measured with this method at frequencies that exceed the self-resonant frequency of the test capacitor. A shunt connection allows the measurement of capacitance from0 to 200 pF at frequencies from 25 to 910 MHz.

The limits shown for frequency and capacitance for shunt measurements may be exceeded, provided the test specimen is not at or near its self-resonant frequency, and the precautions of Section 6.0 are observed.