This document has been prepared by IEC Technical Committee 47, working group 2, Environmental Tests. Activity within working group 2 includes the generation, co-ordination and review of climatic, electrical (of which only ESD , latch up and electrical conditions for life tests are considered), mechanical test methods and associated inspection techniques needed to assess the quality and reliability of the design and manufacture of semiconductor products and processes . This International Standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.