DS DS/EN 60749-13/Corr.1
DS DSEN 60749-13Corr1 2003-DEC-23 Semconductor devces - Mechancal and clmatc test methods - Part 13 Salt atmosphere
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This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.