DS DS/EN 60749-5
DS DSEN 60749-5 2003-JUN-06 Semconductor devces - Mechancal and clmatc test methods - Part 5 Steady-state temperature humdty bas lfe test
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This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of eveluating the reliability of non-hermetic packaged solid-state devices in humid environments.