DS DS/EN 60749-4/Corr.1
DS DSEN 60749-4Corr1 2003-DEC-23 Semconductor devces - Mechancal and clmatc test methods - Part 4 Damp heat steady state hghly accelerated stress test HAST
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This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semicondutor devices in humid environments.