DS DS/EN 60749-1
DS DSEN 60749-1 2003-NOV-07 Semconductor devces - Mechancal and clmatc test methods - Part 1 General
Cart
(empty)
This part of IEC 60479 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all other parts of the series. In case of contradiction between this standard and a relevant procurement specification, the latter should govern.