TIA TIA-526-27
TA TA-526-27 1998-JUL-01 OFSTP-27 Procedure for System-Level Temperature Cycle Endurance Test
TA TA-526-27 1998-JUL-01 OFSTP-27 Procedure for System-Level Temperature Cycle Endurance Test
This procedure is applicable to a fiber-optic equipment whose designed application is for the uncontrolled loop environment. The fiber-optic equipment include all major fiber-optic transport systems (e.g . , OC-I 2 fiber-in-the-loop terminals) and other smaller fiber-optic units (e.g., optical fiber amplifier units).
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