TIA TIA-455-188
TA TA-455-188 1991-DEC-09 FOTP-188 Low Temperature Testng of Fber Optc Components
TA TA-455-188 1991-DEC-09 FOTP-188 Low Temperature Testng of Fber Optc Components
Intent
This procedure is intended for exposing a specimen to the environmental condition of extended low temperature (cold). It is not intended for exposing a specimen to the environmental condition of high temperature or of temperature variation. When high temperature is of interest, use FOTP-4. When temperature variations are of interest, use FOTP-3.
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