This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.

Measurement Philosophy

The near field magnetic or electromagnetic radiation from an integrated circuit can be measured in a controlled manner that yields repeatable results. These emissions are related to the far field electromagnetic radiation potential of the IC and of the electronic module of which it is a part. The intent is to provide a quantitative measure of the RF emissions from ICs for comparison or other purposes. Similar quantitative measures of the immunity of an IC to RF fields and transients are being investigated.

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• SAE J1752-3 : Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
• SAE J1113-21 : (R) Electronmagnetic Compatibility Measurement Procedure for Vehicle Components Part 21: Immunity to Electromagnetic Fields, 30 MHz to 18 GHz, Absorber-Lined Chamber
• SAE J1752-2 : Measurement of Radiated Emissions from Integrated Circuits— Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

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